Fetched in advanced test system from USA, Japan and Taiwan. It has strong power,steady and reliable quality.The testing types are Logical IC,Analog IC, Mix IC, and Memory IC. We can test 3”,4”5”6”and 8” wafer.As customer’s requirements, we can make prober card, exploder wafer testing process,design DUT-Board,　research and develop IC testing main board.And customer can debug the designed DUT-Boards in our testing system. The testing function include inking offline, wafer mapping, analysis of Die and M/P testing.

Producing capacity: 10,000PCS/M

Testing Items: Continuity test, Power dissipation test, Input leakage Current test, Output Voltage level test, Full Functional test, AC test, DC test etc.

Main test technology flatform:

　　SCUD-256 Testing System
　　TR-6800 Testing System.
　　TR-6010 Testing System
　　V777 Testing System
　　UF190B Full Automatic Prober System
　　EG2001X Full Automatic Prober System